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Analog Integrated Circuits and Signal Processing, Vol. 65, Iss. 1, 2010-10 ,pp. : 89-95

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A Current Mirror for Low Voltage, High Performance Analog Circuits

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Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques

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Journal of Electronic Testing, Vol. 17, Iss. 5, 2001-10 ,pp. : 417-425

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Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

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Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

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