A New Approach to the Analysis of Single Event Transients in VLSI Circuits: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

Author： Reorda M. Sonza Violante M.

Publisher： Springer Publishing Company

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.20, Iss.5, 2004-10, pp. : 511-521

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