A Two-Level Power-Grid Model for Transient Current Testing Evaluation: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Alorda B.  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 543-552

Springer Publishing Company

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A New Approach to the Analysis of Single Event Transients in VLSI Circuits: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Reorda M. Sonza   Violante M.  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 511-521

Springer Publishing Company

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Guest Editorial: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Metra Cecilia   Reorda Matteo Sonza  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 463-463

Springer Publishing Company

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IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Nieuwland André K.  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 533-542

Springer Publishing Company

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Efficient Realization of Parity Prediction Functions in FPGAs: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Ko Seok-Bum  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 489-499

Springer Publishing Company

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