Author： Agrawal Vishwani
Publisher： Springer Publishing Company
ISSN： 0923-8174
Source： Journal of Electronic Testing, Vol.22, Iss.4-6, 2006-12, pp. : 307-307
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Mobile Networks and Applications, Vol. 11, Iss. 3, 2006-06 ,pp. :
Access to resources
Recommend
By Hou Y. Ramanathan Parameswaran
Mobile Networks and Applications, Vol. 11, Iss. 1, 2006-02 ,pp. :
By Agrawal V.D.
Journal of Electronic Testing, Vol. 16, Iss. 4, 2000-08 ,pp. :
By Agrawal V.D.
Journal of Electronic Testing, Vol. 16, Iss. 5, 2000-10 ,pp. :
By Agrawal V.D.
Journal of Electronic Testing, Vol. 12, Iss. 3, 1998-06 ,pp. :