Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

Author： Zjajo Amir   Pineda de Gyvez Jose   Gronthoud Guido  

Publisher： Springer Publishing Company

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.22, Iss.4-6, 2006-12, pp. : 399-409

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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