![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Elam David Ayon Arturo A. Pushpa Raj Pudasaini
Publisher: IOP Publishing
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.46, Iss.23, 2013-06, pp. : 235104-235111
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Silicon passivated by insulating erbium oxide films
Technical Physics Letters, Vol. 31, Iss. 2, 2005-02 ,pp. :