Measurements of Raman crystallinity profiles in thin-film microcrystalline silicon solar cells

Author： Choong G.   Vallat-Sauvain E.   Multone X.   Fesquet L.   Kroll U.   Meier J.  

Publisher： IOP Publishing

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.46, Iss.23, 2013-06, pp. : 235105-235109

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