Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon

Author： Komarov P.L.   Burzo M.G.   Kaytaz G.   Raad P.E.  

Publisher： Elsevier

ISSN： 0026-2692

Source： Microelectronics, Vol.34, Iss.12, 2003-12, pp. : 1115-1118

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