Annealing-based heuristics and genetic algorithms for circuit partitioning in parallel test generation

Author: Gil C.   Ortega J.   Diaz A.F.   Montoya M.D.G.  

Publisher: Elsevier

ISSN: 0167-739X

Source: Future Generation Computer Systems, Vol.14, Iss.5, 1998-12, pp. : 439-451

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Abstract