RHEED Intensity Oscillations for the Stoichiometric Growth of \hbox{SrTiO}_{3} Thin Films by Reactive Molecular Beam Epitaxy

Author: Haeni J.H.   Theis C.D.   Schlom D.G.  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.4, Iss.2-3, 2000-06, pp. : 385-391

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