X-ray diffraction and high resolution transmission electron microscopy of 3C-SiC/AlN/6H-SiC(0001)

Author: Edgar J.   Yu Z.   Smith David   Chaudhuri J.   Cheng X.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.12, 1997-12, pp. : 1389-1393

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