Stress relaxation and thermal evolution of film properties in amorphous carbon

Author： Sullivan J.P   Friedmann T.   Baca A.  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.26, Iss.9, 1997-09, pp. : 1021-1029

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Hygrothermal effects upon stress relaxation in a polyimide film

By Harper Brian   Rao Jayathirtha   Kenner Vernal   Popelar Carl  

Journal of Electronic Materials, Vol. 26, Iss. 7, 1997-07 ,pp. : 798-804

Springer Publishing Company

Access to resources Recommend Favorite

Evolution of photovoltaic solar modules dark properties after exposition to electrical reverse stress current inducing thermal effect

By Sidawi Jihad   Zaraket Carine   Habchi Roland   Bassil Nathalie   Salame Chafic   Aillerie Michel   Charles Jean-Pierre  

Microelectronics International, Vol. 31, Iss. 2, 2014-04 ,pp. : 90-98

Emerald Group Publishing Ltd

Access to resources Recommend Favorite

Ultraviolet detecting properties of amorphous MgInO thin film phototransistors

By  

Semiconductor Science and Technology, Vol. 30, Iss. 12, 2015-12 ,pp. : 125010-125015

IOP Publishing

Access to resources Recommend Favorite

Stress relaxation in molding compounds

By Kenner Vernal   Harper Brian   Itkin Vladimir  

Journal of Electronic Materials, Vol. 26, Iss. 7, 1997-07 ,pp. : 821-826

Springer Publishing Company

Access to resources Recommend Favorite

Atomic force microscope investigations of topography, lateral force and electrical properties of metal containing amorphous, hydrogenated carbon thin films

By Kazimierski Piotr   Lehmberg Harald  

International Journal of Electronics, Vol. 81, Iss. 4, 1996-10 ,pp. : 467-472

Taylor & Francis Ltd

Access to resources Recommend Favorite