Author: Westerhout R.J. Musca C.A. Antoszewski J. Dell J.M. Faraone L.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.36, Iss.8, 2007-08, pp. : 884-889
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Analysis of 1/f noise in LWIR HgCdTe photodiodes
By Bae Soo Lee Sang Kim Young Lee Hee Kim Choong
Journal of Electronic Materials, Vol. 29, Iss. 6, 2000-06 ,pp. :
By Rajavel R. Jamba D. Jensen J. Wu O. Beau C. Wilson J. Patten E. Kosai K. Johnson J. Rosbeck J. Goetz P. Johnson S.
Journal of Electronic Materials, Vol. 26, Iss. 6, 1997-06 ,pp. :