Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe

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Journal of Electronic Materials, Vol. 36, Iss. 8, 2007-08 ,pp. : 1106-1109

Springer Publishing Company

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Improved determination of matrix compostion of Hg 1−x Cd x Te by SIMS

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Assessment of Tight Pixel Geometry Influence on Surface Chemistry of Hg 1−X Cd X Te Focal Plane Array by Time of Flight–Secondary Ion Mass Spectroscopy: Novel Analytical Methods

By Garwood G.   Olshove R.   Pettijohn E.   Bangs J.   Liguori M.   Olson E.   Lua F.  

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Vacancies in Hg 1−x Cd x Te

By Chandra D.   Schaake H.   Tregilgas J.   Aqariden F.   Kinch M.   Syllaios A.  

Journal of Electronic Materials, Vol. 29, Iss. 6, 2000-06 ,pp. : 729-731

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Large VLWIR Hg 1−x Cd x Te photovoltaic detectors

By D’Souza A.   Dawson L.   Staller C.   Wijewarnasuriya P.   Dewames R.   Mclevige W.   Arias J.   Edwall D.   Hildebrandt G.  

Journal of Electronic Materials, Vol. 29, Iss. 6, 2000-06 ,pp. : 630-635

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