Structure and phase component of ZrO 2 thin films studied by Raman spectroscopy and X-ray diffraction

Author： Duc Huy L. Laffez P. Daniel P. Jouanneaux A. The Khoi N. Simeone D.

Publisher： Elsevier

ISSN： 0921-5107

Source： Materials Science and Engineering: B, Vol.104, Iss.3, 2003-11, pp. : 163-168

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