Characterization of crystalline europium doped -Y 2 O 3 PLD-films grown on -Al 2 O 3

Author： Burmester P.B.W.   Ishii T.   Huber G.   Kurfiss M.   Schilling M.  

Publisher： Elsevier

ISSN： 0921-5107

Source： Materials Science and Engineering: B, Vol.105, Iss.1, 2003-12, pp. : 24-28

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