On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages

By de Venuto D.  

Journal of Electronic Testing, Vol. 17, Iss. 3-4, 2001-06 ,pp. : 243-253

Springer Publishing Company

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Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift Registers

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Journal of Electronic Testing, Vol. 30, Iss. 1, 2014-02 ,pp. : 77-85

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The effect of small-signal AC voltages on C-V characterization and parameter extraction of SiO 2 thin films

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Testing analogue and mixed-signal integrated circuits by weighted sum of selected node voltages

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Extending Transmission Distance Limitation for a 40 Gb/s Signal over Standard Fiber Using Optical Phase-Conjugation

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