Reduced Impact of Induced Gate Noise on Inductively Degenerated LNAs in Deep Submicron CMOS Technologies: Selected Papers from the NORCHIP 2003 Conference (Guest Editors: Timo Rahkonen and Elmars Bekeris)

Author： Rossi Paolo  

Publisher： Springer Publishing Company

ISSN： 0925-1030

Source： Analog Integrated Circuits and Signal Processing, Vol.42, Iss.1, 2005-01, pp. : 31-36

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