Effects of using a metal layer in total internal reflection fluorescence microscopy

Author： Tang W.T.   Chung E.   Kim Y.   So P.T.C.   Sheppard C.J.R.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.89, Iss.2, 2007-11, pp. : 333-335

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection X‐ray fluorescence

By  

X-RAY SPECTROMETRY, Vol. 44, Iss. 6, 2015-11 ,pp. : 475-475

John Wiley & Sons Inc

Access to resources Recommend Favorite

Total reflection X-ray fluorescence: A technique for trace element analysis in materials

By Misra N.L.   Singh Mudher K.D.  

Progress in Crystal Growth and Characterization of Materials, Vol. 45, Iss. 1, 2002-01 ,pp. : 65-74

Elsevier

Access to resources Recommend Favorite

The quantification of total lead in lipstick specimens by total reflection X‐ray fluorescence spectrometry

By  

X-RAY SPECTROMETRY, Vol. 44, Iss. 6, 2015-11 ,pp. : 451-457

John Wiley & Sons Inc

Access to resources Recommend Favorite

Total reflection X‐Ray fluorescence spectroscopy to study Pb and Zn accumulation in zebrafish embryos

By  

X-RAY SPECTROMETRY, Vol. 44, Iss. 3, 2015-05 ,pp. : 124-128

John Wiley & Sons Inc

Access to resources Recommend Favorite

Photon tunneling in a frustrated total internal reflection structure with a lossy indefinite metamaterial barrier

By Xiang Y.  

Applied Physics A, Vol. 87, Iss. 2, 2007-05 ,pp. : 251-257

Springer Publishing Company

Access to resources Recommend Favorite