Author： Naquin Clint A. Hasan Omar A. Liou Wei-Ting Lee Roxanne R. Halbert Armand J. Phung Anthony T. Liu An-Ting Bursa Emin J. Shen Yulong Taylor David W. Slinker Jason D.
Publisher： IOP Publishing
ISSN： 0957-0233
Source： Measurement Science and Technology, Vol.24, Iss.5, 2013-05, pp. : 55101-55104
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