Fabrication of high quality two-dimensional electron gases by overgrowth of focused ion beam implantation doped Al x Ga 1-x As

Author： Riedesel C.   Meier C.   Schafmeister P.   Reuter D.   Wieck A.D.  

Publisher： Elsevier

ISSN： 1386-9477

Source： Physica E, Vol.17, Iss.unknown, 2003-04, pp. : 503-504

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