Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe deposited on glass substrates

Author: Johann L.   Ennaciri A.   Broch L.   Demange V.   Machizaud F.   Dubois J.M.  

Publisher: Elsevier

ISSN: 1386-9477

Source: Physica E, Vol.17, Iss.unknown, 2003-04, pp. : 552-553

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Abstract