Investigation of different oxidation processes for porous silicon studied by spectroscopic ellipsometry

By Frotscher U.   Rossow U.   Ebert M.   Pietryga C.   Richter W.   Munder H.   Arens-Fischer R.   Berger M.G.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 36-39

Elsevier

Access to resources Recommend Favorite

Investigation of thin Al layer growth with in situ infrared spectroscopic ellipsometry

By Hausmann A.   Weidner G.   Weidner M.   Ritter G.  

Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. : 124-127

Elsevier

Access to resources Recommend Favorite

Evolution of Ge/Si(001) islands upon oxidation and water etching

By Liu C.-P.  

Thin Solid Films, Vol. 415, Iss. 1, 2002-08 ,pp. : 296-302

Elsevier

Access to resources Recommend Favorite

Applications of variable angle spectroscopic ellipsometry to strained SiGe alloy heterostructures

By Heyd A.R.   Alterovitz S.A.   Croke E.T.   Wang K.L.   Lee C.H.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 91-96

Elsevier

Access to resources Recommend Favorite

Optical characterization by spectroscopic ellipsometry of polycrystalline Si 1-x Ge x of variable Ge composition up to 100% Ge

By Ferrieu F.   Morin C.   Regolini J.L.  

Thin Solid Films, Vol. 315, Iss. 1, 1998-03 ,pp. : 316-321

Elsevier

Access to resources Recommend Favorite