JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4  (08-2015)

Period of time： 2015年4期

Publisher： John Wiley & Sons Inc

Founded in： 1968

Total resources： 19

E-ISSN： 1600-5767|48|4

ISSN： 0021-8898

Subject： P Astronomy and Earth Sciences

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4

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The `quasi‐mosaic' effect in crystals and its applications in modern physics

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 977-989

John Wiley & Sons Inc

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Laue pattern analysis for two‐dimensional strain mapping in light‐ion‐implanted polycrystals

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 990-999

John Wiley & Sons Inc

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Three‐dimensional reciprocal space mapping with a two‐dimensional detector as a low‐latency tool for investigating the influence of growth parameters on defects in semipolar GaN

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1000-1010

John Wiley & Sons Inc

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Detection of medium‐range‐order structure in amorphous germanium films by spectroscopic ellipsometry

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1011-1015

John Wiley & Sons Inc

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System for in situ observation of three‐dimensional structural changes in polymer films during uniaxial deformation

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1016-1022

John Wiley & Sons Inc

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Substrate‐stress‐induced magnetic and nonmagnetic structural correlations in Fe/Si multilayers

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1023-1033

John Wiley & Sons Inc

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Quantitative voxel‐to‐voxel comparison of TriBeam and DCT strontium titanate three‐dimensional data sets

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1034-1046

John Wiley & Sons Inc

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Adhesive–adherent interfaces probed with grazing‐incidence small‐angle neutron scattering

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1047-1054

John Wiley & Sons Inc

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Survey of background scattering from materials found in small‐angle neutron scattering

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1055-1071

John Wiley & Sons Inc

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Low‐Z polymer sample supports for fixed‐target serial femtosecond X‐ray crystallography

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 4 , Vol. 48, Iss. 4, 2015-08 , pp. 1072-1079

John Wiley & Sons Inc

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