Period of time: 2004年1期
Publisher: Elsevier
Founded in: 1983
Total resources: 4
ISSN: 0167-9317
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Microelectronic Engineering,volume 69,issue 1
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Electrochemical characterization of copper chemical mechanical polishing
By Du T., Tamboli D., Desai V. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Fabrication of optical transmission elements in an SiN x membrane
By Lee C.C., Chang Y.C., Chang J.Y., Chiu C.F., Chi G.C. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Improving Cu metallization of Si by electrodeposition under centrifugal fields
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.By Park Y.B., Jeon I.S. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Self-excited piezoelectric microcantilever for gas detection
By Zhou J., Li P., Zhang S., Huang Y., Yang P., Bao M., Ruan G. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Simultaneous dose modification for balanced E-beam proximity correction minimizing CD error
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.By Ahn S., Kim D.-W., Kim H.S., Ahn S.J., Cho J. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Formation of C54 TiSi 2 in a cosputtered (Ti+Si) blanket film in the presence of a TiN capping layer
By Pelleg J., Shor Y. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Control of carbon nanotube's shape by ion bombardment
By Lim H., Jung H., Joo S.-K. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.Investigation into patterning of a stack-type Ru electrode capacitor
By Kim H.W., Kang C.-J. in (2003)
Microelectronic Engineering,volume 69,issue 1 , Vol. 69, Iss. 1, 2003-08 , pp.