![](/images/ico/ico_close.png)
![](/images/ico/ico3.png)
Period of time: 2014年2期
Publisher: Emerald Group Publishing Ltd
Founded in: 1982
Total resources: 58
ISSN: 1356-5362
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Microelectronics International,volume 31,issue 2
Menu
![](/images/ico/ico5.png)
Analysis of misalignment-induced deformation in three-dimensional semiconductor chip stacks
By Johnson Richard W.,Shen Yu-Lin in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
Dynamic reliability approach of chip scale package assembly under vibration environment
By Yang Ping,Tang Xiusheng,Liu Yu,Wang Shuting,Yang Jianming in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
Silicon nanowire fabrication: Silicon trimming via shallow anisotropic etching
By Adam Tijjani,Hashim U. in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
Connection of electronic and microelectronic modules
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
By Sidawi Jihad,Zaraket Carine,Habchi Roland,Bassil Nathalie,Salame Chafic,Aillerie Michel,Charles Jean-Pierre in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
The effect of microwave radiation on polyvinyl chloride-graphite thick film resistors
By Venkatasubrahmanayam Kandagaddla,Babu Busi Ram,Poornaiah Billa,Rao Yarravarapu Srinivasa in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
Fabrication and characterization of a single-bridge nanorod between microgap electrodes
By Humayun Qazi,Kashif Muhammad,Hashim Uda in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
The tunnelling and electron injection reliabilities for FG transistors
By Mabuza Bongani C.,Sinha Saurabh in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
RF characteristics of 0.13-µm NMOS transistors for millimeter-wave application
By Hassan Siti Maisurah Mohd,Yusof Yusman M.,Marzuki Arjuna,Farid Nazif Emran,Rahim Siti Amalina Enche Ab,Ali Mohd Hafis M. in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.![](/images/ico/ico5.png)
By Gan Chong Leong,Classe Francis,Chan Bak Lee,Hashim Uda in (2014)
Microelectronics International,volume 31,issue 2 , Vol. 31, Iss. 2, 2014-04 , pp.