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Period of time: 2014年9期
Publisher: IOP Publishing
Founded in: 1986
Total resources: 42
ISSN: 0268-1242
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Semiconductor Science and Technology,volume 29,issue 9
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By Radhanpura K,Lewis R A,Sirbu L,Enachi M,Tiginyanu I M,Skuratov V A in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
UV-assisted rapid thermal annealing for solution-processed zinc oxide thin-film transistors
By Hwang Jaeeun,Park Jaehoon,Kim Hongdoo in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
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A simplified thermal model for lateral MOSFET and its application to temperature monitoring
By Carvajal M A,Martínez-García M S,Martínez-Olmos A,Banqueri J,Palma A J in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
Straining Ge bulk and nanomembranes for optoelectronic applications: a systematic numerical analysis
By Scopece Daniele,Montalenti Francesco,Bollani Monica,Chrastina Daniel,Bonera Emiliano in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
By Stesmans A,Iacovo S,Nguyen S,Afanas’ev V V,Baklanov M R,Urbanowicz A M in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
By Takagaki Y,Jahn U,Jenichen B,Berlin K,Kong X,Biermann K in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
Stress analysis of ultra-thin silicon chip-on-foil electronic assembly under bending
By Wacker Nicoleta,Richter Harald,Hoang Tu,Gazdzicki Pawel,Schulze Mathias,Angelopoulos Evangelos A,Hassan Mahadi-Ul,Burghartz Joachim N in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.![](/images/ico/ico5.png)
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Analysis of interface trap states in InAlN/AlN/GaN heterostructures
By Zhou Yang,Lin Zhaojun,Luan Chongbiao,Zhao Jingtao,Yang Qihao,Yang Ming,Wang Yutang,Feng Zhihong,Lv Yuanjie in (2014)
Semiconductor Science and Technology,volume 29,issue 9 , Vol. 29, Iss. 9, 2014-09 , pp.