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Period of time: 2014年3期
Publisher: MAIK Nauka/Interperiodica
Founded in: 1972
Total resources: 32
ISSN: 1063-7397
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Russian Microelectronics,volume 35,issue 3
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Foreword to the special issue on ionizing-radiation effects in microelectronics
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
By Nikiforov A.,Skorobogatov P. in (2006)
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
Estimating the IC upset/failure threshold of dose rate for a radiation pulse sequence
By Chumakov A.,Gontar’ V. in (2006)
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
Modeling rail-span collapse in ICs exposed to a single radiation pulse
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
By Kirgizova A.,Nikiforov A.,Grigor’ev N.,Poljakov I.,Skorobogatov P. in (2006)
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
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Modeling neutron ionization effects on high-density CMOS circuit elements
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.![](/images/ico/ico5.png)
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Enhancing the performance of radiation-hardened embedded computer systems
Russian Microelectronics,volume 35,issue 3 , Vol. 35, Iss. 3, 2006-05 , pp.