Dominant mechanisms of transient-radiation upset in CMOS RAM VLSI circuits realized in SOS technology

Author: Kirgizova A.   Nikiforov A.   Grigor’ev N.   Poljakov I.   Skorobogatov P.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7397

Source: Russian Microelectronics, Vol.35, Iss.3, 2006-05, pp. : 162-176

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Abstract