Journal of Electron Microscopy,volume 51,issue 1  (03-2013)

Period of time: 2013年1期

Publisher: Oxford University Press

Founded in: 1953

Total resources: 76

ISSN: 0022-0744

Subject: Q93 Microbiology

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Journal of Electron Microscopy,volume 51,issue 1

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Low voltage FE‐STEM for characterization of state‐of‐the‐art silicon SRAM

By Nakagawa1 *- Mine,Dunne2 *- Robert,Koike3 Hidemi,Sato3 Mitsugu,Pérez‐Camacho2 Juan J. in (2002)

Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp. 53-57

Oxford University Press

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