Period of time: 2013年1期
Publisher: Oxford University Press
Founded in: 1953
Total resources: 76
ISSN: 0022-0744
Subject: Q93 Microbiology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electron Microscopy,volume 51,issue 1
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By Tokumasu1 Fuyuki,Jin2 Albert J. in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.A TEM study on melt‐crystallized poly (butylene terephthalate)
By Manabe1 *- Norio,Yokota1 Yoshimitsu,Minami1 Hiroaki,Uegomori1 Yuya in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.By Yamaguchi1 *- Masashi,Biswas1 Sondip Kumar,Kita2 Shigeo,Aikawa2 Eizo in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.By Shindo* Daisuke,Ikematsu1 Yoichi,Lee Chang‐Woo,Suzuki2 Tohru,Ichihashi3 Toshinari in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.By Takayama1 2- Tetsuya,Tatsukawa2 Shuji,Kitamura2 Hirokazu,Ina2 Keisuke,Nakatsuka1 Kazuo in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.By Weißbäcker* Christoph in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.Low voltage FE‐STEM for characterization of state‐of‐the‐art silicon SRAM
By Nakagawa1 *- Mine,Dunne2 *- Robert,Koike3 Hidemi,Sato3 Mitsugu,Pérez‐Camacho2 Juan J. in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.A SAED and HREM study of structural defects in brownmillerite, LaBa x Sr 1‐x CuGaO y related oxides
By Ruiz‐González María Luisa in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.Simulations of Kikuchi patterns due to thermal diffuse scattering on MgO crystals
By Omoto Kazuya,Tsuda* Kenji in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.Sub‐micromorphology of the epicuticle of hornets: AFM studies
By Ishay1 *- Jacob S.,Litinetsky1 Luba,Pertsis1 Vitaly,Barkay2 Zahava in (2002)
Journal of Electron Microscopy,volume 51,issue 1 , Vol. 51, Iss. 1, 2002-03 , pp.