Journal of Electron Microscopy,volume 54,issue 3  (06-2013)

Period of time： 2013年3期

Publisher： Oxford University Press

Founded in： 1953

Total resources： 76

ISSN： 0022-0744

Subject： Q93 Microbiology

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Journal of Electron Microscopy,volume 54,issue 3

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Foreword

By Ichinose Hideki,Smith David J. in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 147-147

Oxford University Press

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In Memory of the late Professor John M. Cowley

By Iijima Sumio in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 149-149

Oxford University Press

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The MIDAS project at ASU: John Cowley's vision and practical results

By Venables J. A. in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 151-162

Oxford University Press

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Electron diffraction from laser-aligned beams of large hydrated molecules

By Spence John C H in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 163-168

Oxford University Press

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Calibration of projector lens distortions

By Hüe F. in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 181-190

Oxford University Press

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Phase measurement of atomic resolution image using transport of intensity equation

By Ishizuka Kazuo in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 191-197

Oxford University Press

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Electron atomic scattering factors, Debye–Waller factors and the optical potential for high-energy electron diffraction

By Peng Lian-Mao in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 199-207

Oxford University Press

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A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM

By Yamasaki Jun,Kawai Tomoyuki,Tanaka Nobuo in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 209-214

Oxford University Press

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Development of a real-time stereo transmission electron microscope

By Tanji Takayoshi,Tanaka Hiromochi,Kojima Takayuki in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 215-222

Oxford University Press

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Contrast analysis of dislocation images in TEM–cathodoluminescence technique

By Nakaji D. in (2005)

Journal of Electron Microscopy,volume 54,issue 3 , Vol. 54, Iss. 3, 2005-06 , pp. 223-230

Oxford University Press

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