Author: Hüe F.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.54, Iss.3, 2005-06, pp. : 181-190
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Ricolleau Christian Nelayah Jaysen Oikawa Tetsuo Kohno Yuji Braidy Nadi Wang Guillaulle Hue Florian Florea Lenuta Pierron Bohnes Vronique Alloyeau Damien
Journal of Electron Microscopy, Vol. 62, Iss. 2, 2013-04 ,pp. :