Period of time: 2014年1期
Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
ISSN: 0923-8174
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing,volume 30,issue 1
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Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
By Guin Ujjwal,DiMase Daniel,Tehranipoor Mohammad in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
By Guin Ujjwal,DiMase Daniel,Tehranipoor Mohammad in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
By Favalli M.,Dalpasso M. in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.By Zhang Bei,Agrawal Vishwani in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.By Krishna K.,Sailaja M. in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.By Rekik Ahmed,Azaïs Florence,Mailly Frédérick,Nouet Pascal in (2014)
Journal of Electronic Testing,volume 30,issue 1 , Vol. 30, Iss. 1, 2014-02 , pp.