Journal of Electronic Testing,volume 15,issue 3  (12-2014)

Period of time： 2014年3期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Journal of Electronic Testing,volume 15,issue 3

Menu

Editorial

By Agrawal V.D. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 215-215

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Hybrid Fault Simulation for Synchronous Sequential Circuits

By Becker B. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 219-238

Springer Publishing Company

Abstract Access to resources Recommend Favorite

On Non-Statistical Techniques for Fast Fault Coverage Estimation

By Hsiao M.S. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 239-254

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Decentralized BIST Methodology for System Level Interconnects

By Su C. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 255-265

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections

By Savir J. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 279-296

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Tree-Structured Linear Cellular Automata and Their Applications in BIST

By Li J. in (1999)

Journal of Electronic Testing,volume 15,issue 3 , Vol. 15, Iss. 3, 1999-12 , pp. 297-300

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Total 6 item(s)