Journal of Electronic Testing,volume 20,issue 6  (12-2014)

Period of time： 2014年6期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 20,issue 6

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Editorial

By Agrawal Vishwani D. in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 571-571

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List of Reviewers

By in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 573-574

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Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation

By Navabi Zainalabedin in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 575-589

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Modeling Custom Digital Circuits for Test

By Bose Soumitra in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 591-609

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A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

By Goessel Michael in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 611-622

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A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs

By Rafeeque K.P. Sunil in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 623-638

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Scan Test Strategy for Asynchronous-Synchronous Interfaces

By Petre Octavian in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 639-645

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Power-Driven Routing-Constrained Scan Chain Design

By Bonhomme Y. in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 647-660

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Area Minimization of Exclusive-OR Intensive Circuits in FPGAs

By Ko Seok-Bum in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 661-665

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On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression

By Li Lei in (2004)

Journal of Electronic Testing,volume 20,issue 6 , Vol. 20, Iss. 6, 2004-12 , pp. 667-670

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