Implementing Symmetric Functions with Hierarchical Modules for Stuck-At and Path-Delay Fault Testability

By Rahaman Hafizur  

Journal of Electronic Testing, Vol. 22, Iss. 2, 2006-04 ,pp. : 125-142

Springer Publishing Company

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Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors

By Liu X.  

Journal of Electronic Testing, Vol. 19, Iss. 4, 2003-08 ,pp. : 437-445

Springer Publishing Company

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Synthesis of Scan Chains for Netlist Descriptions at RT-Level

By Huang Y.  

Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. : 189-201

Springer Publishing Company

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Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments

By Leveugle R.  

Journal of Electronic Testing, Vol. 19, Iss. 5, 2003-10 ,pp. : 559-575

Springer Publishing Company

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Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation

By Ammari A.  

Journal of Electronic Testing, Vol. 21, Iss. 4, 2005-08 ,pp. : 365-376

Springer Publishing Company

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