Journal of Electronic Testing,volume 21,issue 2  (04-2014)

Period of time： 2014年2期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 21,issue 2

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Editorial

By Agrawal Vishwani in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 111-111

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Test Technology Technical Council Newsletter

By Kim B. in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 113-114

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Error Diagnosis of Sequential Circuits Using Region-Based Model

By D’Souza Anand in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 115-126

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An Analog Circuit Fault Characterization Methodology

By Maidon Yvan in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 127-134

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Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks

By Balen Tiago in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 135-146

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Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

By Bhunia Swarup in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 147-159

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Phase Shifter Merging

By Kagaris Dimitri in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 161-168

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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

By Borri Simone in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 169-179

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Selection of Crosstalk-Induced Faults in Enhanced Delay Test

By Li Huawei in (2005)

Journal of Electronic Testing,volume 21,issue 2 , Vol. 21, Iss. 2, 2005-04 , pp. 181-195

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Total 9 item(s)