Journal of Electronic Testing,volume 21,issue 3  (06-2014)

Period of time： 2014年3期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 21,issue 3

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Editorial

By Agrawal Vishwani in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 199-199

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Test Technology Technical Council Newsletter

By Kim B. in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 201-201

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Guest Editorial

By Rueda Adoración,Renovell Michel,Huertas José in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 203-203

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An On-Chip Spectrum Analyzer for Analog Built-In Testing

By Méndez-Rivera Marcia in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 205-219

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Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST

By Vázquez Diego,Huertas Gloria,Luque África,Barragán Manuel,Leger Gildas,Rueda Adoración,Huertas José in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 221-232

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On-Chip Pseudorandom MEMS Testing

By Rufer L. in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 233-241

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Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current

By Bhunia Swarup in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 243-255

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Testing Biquad Filters under Parametric Shifts Using X-Y Zoning

By Sanahuja R. in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 257-265

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Detection and Evaluation of Deterministic Jitter Causes in CP-PLL’s Due to Macro Level Faults and Pre-Detection Using Simple Methods

By Burbidge Martin in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 267-281

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Low Cost BIST for Static and Dynamic Testing of ADCs

By Gloria Flores Maria in (2005)

Journal of Electronic Testing,volume 21,issue 3 , Vol. 21, Iss. 3, 2005-06 , pp. 283-290

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