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Journal of Electronic Testing, Vol. 13, Iss. 1, 1998-08 ,pp. : 7-17

Springer Publishing Company

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Detection of Delay Faults in Memory Address Decoders

By Gizdarski E.  

Journal of Electronic Testing, Vol. 16, Iss. 4, 2000-08 ,pp. : 381-387

Springer Publishing Company

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A low jitter PLL clock used for phase change memory

By Xiao Hong   Houpeng Chen   Zhitang Song   Daolin Cai   Xi Li  

Journal of Semiconductors, Vol. 34, Iss. 2, 2013-02 ,pp. : 25012-25016

IOP Publishing

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Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

By Harutunyan G.  

Journal of Electronic Testing, Vol. 23, Iss. 1, 2007-02 ,pp. : 55-74

Springer Publishing Company

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High Impedance Fault Detection Relaying Scheme for Arc Type Faults

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Recent Advances in Communications and Networking Technology (Formerly Recent Patents on Telecommunication), Vol. 4, Iss. 2, 2015-08 ,pp. : 90-94

Bentham Science Publishers

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