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Period of time: 2014年3期
Publisher: Taylor & Francis Ltd
Founded in: 1959
Total resources: 8
ISSN: 0040-1706
Subject: T-1 Technology Status and Development
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Technometrics,volume 56,issue 3
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Case-Deletion Diagnostics for Linear Mixed Models
By Pan Jianxin,Fei Yu,Foster Peter in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
Pointwise and Simultaneous Tolerance Limits Under Logistic Regression
By Zimmer Zachary,Park DoHwan,Mathew Thomas in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
A Test of Stationarity for Textured Images
By Taylor Sarah L.,Eckley Idris A.,Nunes Matthew A. in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
The Inverse Gaussian Process as a Degradation Model
By Ye Zhi-Sheng,Chen Nan in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
A Piecewise Single-Index Model for Dimension Reduction
By Wang Tianhao,Xia Yingcun in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
Statistical Process Control Using a Dynamic Sampling Scheme
By Li Zhonghua,Qiu Peihua in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
Time-Between-Event Control Charts for Sampling Inspection
By Qu Liang,Wu Zhang,Khoo Michael B. C.,Rahim Abdur in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
By Chen Kehui,Müller Hans-Georg in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
By Grego John,Li Shuang,Lynch James,Sethuraman Jayaram in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.![](/images/ico/ico5.png)
Surrogate Modeling of Computer Experiments With Different Mesh Densities
By Tuo Rui,Wu C. F. Jeff,Yu Dan in (2014)
Technometrics,volume 56,issue 3 , Vol. 56, Iss. 3, 2014-07 , pp.