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Taylor & Francis Ltd

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Surface observation of Mo nanocrystals deposited on Si (111) thin films by a newly developed ultrahigh vacuum field-emission transmission electron microscope

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Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 110-114

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The effect of low dielectric polymer thickness on the electromigration characteristics of Al(1% Cu-0.5% Si) thin films

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Temperature-coefficient-of-resistance characteristics of sputter-deposited Ni x Al 1-x thin films for 0.5

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Thin Solid Films, Vol. 441, Iss. 1, 2003-09 ,pp. : 298-306

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Effect of coating thickness on friction for carbon nitride films in repeated sliding against a spherical diamond with nano-scale asperities

By Wang D.F.   Kato K.  

Wear, Vol. 252, Iss. 3, 2002-02 ,pp. : 210-219

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