Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

Author： Ono S. Takeuchi M. Takahashi T.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.91, Iss.1, 2002-05, pp. : 127-132

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