Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

By Longo D.M.   Howe J.M.   Johnson W.C.  

Ultramicroscopy, Vol. 80, Iss. 2, 1999-10 ,pp. : 69-84

Elsevier

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The effect of secondary electrons generated in a commercial FEG-TEM on electron energy-loss spectra

By McComb D.W.   Weatherly G.C.  

Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. : 61-67

Elsevier

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Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope

By Volkl E.   Allard L.F.   Datye A.   Frost B.  

Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. : 97-103

Elsevier

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Towards sub-nanometer scale EELS analysis of polymers in the TEM

By Varlot K.   Martin J.M.   Quet C.   Kihn Y.  

Ultramicroscopy, Vol. 68, Iss. 2, 1997-06 ,pp. : 123-133

Elsevier

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A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

By Hutchinson C.R.   Hackenberg R.E.   Shiflet G.J.  

Ultramicroscopy, Vol. 94, Iss. 1, 2003-01 ,pp. : 37-48

Elsevier

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