Focused ion-beam milling for field-ion specimen preparation: - preliminary investigations

By Larson D.J.   Foord D.T.   Petford-Long A.K.   Anthony T.C.   Rozdilsky I.M.   Cerezo A.   Smith G.W.D.  

Ultramicroscopy, Vol. 75, Iss. 3, 1998-12 ,pp. : 147-159

Elsevier

Access to resources Recommend Favorite

The field emission properties of high aspect ratio diamond nanocone arrays fabricated by focused ion beam milling

By  

Science and Technology of Advanced Materials, Vol. 6, Iss. 7, 2005-10 ,pp. : 79-83

IOP Publishing

Access to resources Recommend Favorite

A novel approach to gaseous field ion sources for focused ion beam applications

By Miller M.K.   Sijbrandij S.J.  

Ultramicroscopy, Vol. 79, Iss. 1, 1999-09 ,pp. : 225-230

Elsevier

Access to resources Recommend Favorite

Imaging of fullerene-like structures in CN x thin films by electron microscopy; sample preparation artefacts due to ion-beam milling

By Czigany Z.   Neidhardt J.   Brunell I.F.   Hultman L.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 163-173

Elsevier

Access to resources Recommend Favorite

Field ion specimen preparation from near-surface regions - Principles and Applications to Materials Problems

By Larson D.J.   Miller M.K.   Ulfig R.M.   Matyi R.J.   Camus P.P.   Kelly T.F.  

Ultramicroscopy, Vol. 73, Iss. 1, 1998-06 ,pp. : 273-278

Elsevier

Access to resources Recommend Favorite