Focused ion-beam milling for field-ion specimen preparation: - preliminary investigations

Author： Larson D.J.   Foord D.T.   Petford-Long A.K.   Anthony T.C.   Rozdilsky I.M.   Cerezo A.   Smith G.W.D.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.75, Iss.3, 1998-12, pp. : 147-159

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