Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

Author： Huntington S.T. Hartley P.G. Katsifolis J.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.94, Iss.3, 2003-04, pp. : 283-291

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