Etch Properties of Hf-Based High-k Dielectrics Using Inductively Coupled Plasma

Author: Kim Gwan-Ha   Kim Kyoung-Tae   Woo Jong-Chang   Kim Chang-Il  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.357, Iss.1, 2007-01, pp. : 41-47

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract