Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

Author: Metzger T.   Hopler R.   Born E.   Ambacher O.   Stutzmann M.   Stommer R.   Schuster M.   Gobel H.   Christiansen S.   Albrecht M.   Strunk H. P.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.77, Iss.4, 1998-04, pp. : 1013-1025

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