Crystallization of amorphous Si 0.5 Ge 0.5 films studied by means of in-situ X-ray diffraction and in-situ transmission electron microscopy

Author: Edelman F.   Raz T.   Komem Y.   Zaumseil P.   Osten H. -J.   Capitan M.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.11, 1999-11, pp. : 2617-2628

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