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Taylor & Francis Ltd

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Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains

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In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures

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Transmission electron microscopy studies of dislocations in physical-vapour-transport-grown silicon carbide

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Observation of Basal Plane Dislocation in 4H-SiC Wafer by Mirror Projection Electron Microscopy and Low-Energy SEM

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